SMEAL WIKI

Multifractal Analysis of Image Profiles for the Characterization and Detection of Defects in Additive Manufacturing

Bing Yao, Farhad Imani, Aniket Sunil Sakpal, Edward W. Reutzel, Hui Yang
Year2017
VenueJournal of Manufacturing Science and Engineering
Typearticle
Citations112
DOI10.1115/1.4037891
OpenAlexW2753947513

Topics

Industrial Vision Systems and Defect DetectionSubtractive colorCharacterization (materials science)Computer scienceProcess (computing)Quality (philosophy)