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Industrial Vision Systems and Defect Detection
OpenAlex topic - T12111
Field
Engineering
Subfield
Industrial and Manufacturing Engineering
Domain
Physical Sciences
OpenAlex
T12111
Smeal faculty
Edward T. Reutzel
- score 1.0
Papers
Multifractal Analysis of Image Profiles for the Characterization and Detection of Defects in Additive Manufacturing
(2017)
- cites 112