SMEAL WIKI

Characterization (materials science)

OpenAlex concept - C2780841128

Field
Subfield
Domain
OpenAlex	C2780841128

Smeal faculty

Edward T. Reutzel - score 0.6

Papers

Multifractal Analysis of Image Profiles for the Characterization and Detection of Defects in Additive Manufacturing (2017) - cites 112